Mr.
John Cooper
Tagline
Ruggedizing Products to Last Longer - analysis, testing, training
Contact
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Phone+16502073664 (Work)+16502073664 (Cell)
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Email
Biography
Reliability Engineer Consultant: Predictions, Circuit Stress Analysis, Silicon Valley.
• identify design weaknesses, and verify improvements to give longer product life and robustness
• Reliability Test Plans, training for ruggedizing products, including MTBF model, HALT & HASS testing, Reliability Predictions, FMEA / FMECA, Reliability testing with RDT and ALT, Stress & Derating analysis, and Product Quality reviews. Physics of Failure analysis (Sherlock), Weibull.
• Developed Quality and Reliability strategies for medical instruments / surgical robots, telecommunications products, networking equipment, power, consumer products, medical instrumentation, artillery, industrial equipment, toys, from concept to production.
• Developed compliance, safety and quality strategy for batteries, consumer products and educational toys; battery safety compliance
• Implemented overseas Reliability & Quality methods at Contract Manufacturers
Technical Expertise
Special Skills
Technical Specialties
Product Reliability - Strategy, Assessment Design Analysis, Circuit Stress Prediction (MTBF) HALT and HASS, Accelerated Life Testing FMEA, FMECA - RDT - Reliability Demonstration Test Weibull Training; Contract and Part Time Engineering services; Training in FMECA and these other topics. Professional Engineer, Electrical, State of California.
Additional Specialties
Relex/Windchill Reliability, Item Software, Agile System (Documentation) Oracle ReliabSoft
Interests
Experience
Other Professional/Technical
Employer Unknown
Publications
John Cooper and Daniel Kwak, "Reliability Testing of Consumer Products," in Pan Pacific Microelectronics Symposium (Pan Pacific), 2020
John Cooper and , "Reliability Engineering Techniques for Consumer Products," in 2019 Pan Pacific Microelectronics Symposium (Pan Pacific), 2019
John Cooper and , "Introduction to HALT - making your product robust," in 2017 Pan Pacific Microelectronics Symposium (Pan Pacific), 2017
John Cooper and Daniel Kwak, "An overview of reliability," in Pan Pacific Microelectronics Symposium (Pan Pacific), 2017