Prof. Valeriu Beiu

Publications
Walid Ibrahim and Valeriu Beiu, "Device-level reliability of several full adder cells," 10th IEEE International Conference on Nanotechnology, pp. 1082 - 1087.
Walid Ibrahim and Valeriu Beiu, "Threshold Voltage Variations Make Full Adders Reliabilities Similar," IEEE Transactions on Nanotechnology, vol. 9, pp. 664 - 667.
Azam Beg and Valeriu Beiu, "Ultra low power/energy SET-based axon-inspired communication," 2011 11th IEEE International Conference on Nanotechnology, pp. 1183 - 1186.
Valeriu Beiu, Azam Beg, and Walid Ibrahim, "Atto-Joule gates for the whole voltage range," 2011 11th IEEE International Conference on Nanotechnology, pp. 1424 - 1429.
Walid Ibrahim and Valeriu Beiu, "Reliability of NAND-2 CMOS gates from threshold voltage variations," 2009 International Conference on Innovations in Information Technology (IIT), pp. 135 - 139.