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Prof.
Mansour Assaf
Biography
Dr. Assaf joined The University of the South Pacific in 2010. Prior to USP, he was Associate Professor at The University of Trinidad and Tobago. Before that, he served as a Research Scholar and Lecturer at The School of Information Technology and Engineering of the University of Ottawa, Ottawa, Ontario, Canada. He received his Ph.D. in Electrical Engineering from UOO where he also received his M.A.Sc. in Electrical Engineering and the B.A.Sc. degree in Telecommunications. He holds a B.Sc. degree in Applied Physics from The Lebanese University. His research interests are in the areas of computer architecture, mixed-signal analysis, hardware/software co-design and test, fault-tolerant computing, distributed detection in sensor networks, and RFID technologies. Dr. Assaf is a senior member of the IEEE, a senior member of the ACM, and Vice-chair IEEE sub-section (2016-2022). He received the 2003 IEEE Donald G. Fink Prize Paper Award.
Awards
Donald G.Fink Prize Paper
Publications
Sunil R. Das, Sujoy MukherjeeEmil M. PetriuMansour H Assaf, and Altaf Hossain, "Space Compaction for Embedded Cores-Based System-on-Chips (SOCs) Using Fault Graded Output Merger," 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007, pp. 1 - 5.
Sunil R. Das, Altaf HossainJun -F. LiEmil M. PetriuSatyendra N. BiswasWen -B. Jone, et al., "Further studies on improved test efficiency in cores-based system-on-chips using ModelSim verification tool," 2009 IEEE Instrumentation and Measurement Technology Conference, pp. 1132 - 1137.
S. R. Das, E. M. PetriuT. F. BarakatM. H. Assaf, and A. R. Nayak, "Space compaction under generalized mergeability," IEEE Transactions on Instrumentation and Measurement, vol. 47, pp. 1283 - 1293.
S. R. Das, A. R. NayakM. H. Assaf, and W. -B. Jone, "Realizing ultimate compression with acceptable fault coverage degradation to reduce MISR size in BIST applications by nonexhaustive test patterns," Circuits and Systems, 1997. ISCAS '97., Proceedings of 1997 IEEE International Symposium on, pp. 2717 - 2720 vol.4.
Mohammed Elbadri, Voicu GrozaRami Abielmona, and Mansour Assaf, "A Reconfigurable Processing Unit for Digital Circuit Testing using Built-In Self-Test Techniques," 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings, pp. 239 - 244.